Anomalous Dependence of the Intensity of X-Ray Reflections of Cs2SO4 on the Crystallite Size and Shape
- Authors: Shmyt’ko I.M.1, Kedrov V.V.1, Aronin A.S.1
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Affiliations:
- Institute of Solid State Physics
- Issue: Vol 60, No 2 (2018)
- Pages: 390-396
- Section: Low-Dimensional Systems
- URL: https://journal-vniispk.ru/1063-7834/article/view/202169
- DOI: https://doi.org/10.1134/S1063783418020269
- ID: 202169
Cite item
Abstract
Detailed X-ray and electron microscopy analyses of Cs2SO4 powders consisting of sphere- and platelike crystallites have been carried out. It is established that the intensity distributions of X-ray reflections in both cases radically differ, with the position on the diffraction-angle axis retained in accordance with the PDF-2 database. Electron microscopy microdiffraction investigations of the orientation of developed surfaces of platelike crystallites revealed four different directions; however, these directions could not provide texture amplification of a number of observed (hkl) reflections. It is suggested that the intensity redistribution is based on the sphericity of X-ray waves incident on the sample.
About the authors
I. M. Shmyt’ko
Institute of Solid State Physics
Author for correspondence.
Email: shim@issp.ac.ru
Russian Federation, Chernogolovka, Moscow oblast, 142432
V. V. Kedrov
Institute of Solid State Physics
Email: shim@issp.ac.ru
Russian Federation, Chernogolovka, Moscow oblast, 142432
A. S. Aronin
Institute of Solid State Physics
Email: shim@issp.ac.ru
Russian Federation, Chernogolovka, Moscow oblast, 142432
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