Anomalous Dependence of the Intensity of X-Ray Reflections of Cs2SO4 on the Crystallite Size and Shape


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Abstract

Detailed X-ray and electron microscopy analyses of Cs2SO4 powders consisting of sphere- and platelike crystallites have been carried out. It is established that the intensity distributions of X-ray reflections in both cases radically differ, with the position on the diffraction-angle axis retained in accordance with the PDF-2 database. Electron microscopy microdiffraction investigations of the orientation of developed surfaces of platelike crystallites revealed four different directions; however, these directions could not provide texture amplification of a number of observed (hkl) reflections. It is suggested that the intensity redistribution is based on the sphericity of X-ray waves incident on the sample.

About the authors

I. M. Shmyt’ko

Institute of Solid State Physics

Author for correspondence.
Email: shim@issp.ac.ru
Russian Federation, Chernogolovka, Moscow oblast, 142432

V. V. Kedrov

Institute of Solid State Physics

Email: shim@issp.ac.ru
Russian Federation, Chernogolovka, Moscow oblast, 142432

A. S. Aronin

Institute of Solid State Physics

Email: shim@issp.ac.ru
Russian Federation, Chernogolovka, Moscow oblast, 142432

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