Localization of the Wannier–Mott Exciton on a Langmuir-Film/CdS Organic Semiconductor Interface
- Authors: Korolkova K.A.1, Novak V.R.2, Sel’kin A.V.1,3
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Affiliations:
- Ioffe Institute
- NT-MDT Spectrum Instruments Ltd.
- St. Petersburg State University
- Issue: Vol 61, No 7 (2019)
- Pages: 1304-1309
- Section: Surface Physics and Thin Films
- URL: https://journal-vniispk.ru/1063-7834/article/view/205953
- DOI: https://doi.org/10.1134/S1063783419070175
- ID: 205953
Cite item
Abstract
The low-temperature (T = 2 K) light reflectance spectra of organic semiconductor structures produced by depositing Langmuir–Blodgett films on a cadmium sulfide (CdS) crystal surface are studied. The spectra were studied in the region of the resonant frequency of the exciton state An = 1 in CdS. The spectra were analyzed within a multilayer medium model with allowance for the spatial dispersion and an exciton-free “dead” layer near the crystal surface contacting with the film. A conclusion is made that, as a result of the deposition of an organic film on a semiconductor crystal surface, the Wanier–Mott exciton is spatially localized near the film–crystal interface.
About the authors
K. A. Korolkova
Ioffe Institute
Author for correspondence.
Email: ksenia.korolikova@gmail.com
Russian Federation, St. Petersburg, 194021
V. R. Novak
NT-MDT Spectrum Instruments Ltd.
Email: ksenia.korolikova@gmail.com
Russian Federation, Moscow, 124460
A. V. Sel’kin
Ioffe Institute; St. Petersburg State University
Email: ksenia.korolikova@gmail.com
Russian Federation, St. Petersburg, 194021; St. Petersburg, 199034
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