Impurity Effects on Nucleation and Growth of SiC Clusters and Layers on Si(100) and Si(111)
- Authors: Pezoldt J.1, Lubov M.N.2, Kharlamov V.S.3
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Affiliations:
- Technische Universität Ilmenau
- St. Petersburg Academic University
- Ioffe Institute
- Issue: Vol 61, No 12 (2019)
- Pages: 2468-2472
- Section: Surface Physics and Thin Films
- URL: https://journal-vniispk.ru/1063-7834/article/view/207123
- DOI: https://doi.org/10.1134/S1063783419120382
- ID: 207123
Cite item
Abstract
A kinetic Monte Carlo model of silicon carbide growth on silicon surface is proposed. Based on this model, the growth of silicon carbide clusters on silicon in the presence of a pre-deposited impurity of various types: attractive and repulsive, is studied. The density of silicon carbide clusters on silicon is calculated. Calculations of the dependencies of the silicon carbide clusters density on the impurity mobility are carried out. The process of redistribution of the species in the multi-component C|Ge|Si structure during annealing is studied in the framework of the kinetic approach. Concentration profiles of the structure components are determined.
About the authors
J. Pezoldt
Technische Universität Ilmenau
Author for correspondence.
Email: joerg.pezoldt@tu-ilmenau.de
Germany, Ilmenau
M. N. Lubov
St. Petersburg Academic University
Email: joerg.pezoldt@tu-ilmenau.de
Russian Federation, St. Petersburg
V. S. Kharlamov
Ioffe Institute
Email: joerg.pezoldt@tu-ilmenau.de
Russian Federation, St. Petersburg
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