On the size dependence of melting parameters for silicon


Cite item

Full Text

Open Access Open Access
Restricted Access Access granted
Restricted Access Subscription Access

Abstract

Using the dependences of melting point Tm and crystallization point Tc on the number of atoms (N) in a spherical silicon crystal that were calculated elsewhere [6] by the method of molecular dynamics, (i) the number of atoms at which the latent heat of the solid–liquid phase transition disappears and (ii) temperature T0 = Tm(N0) = Tc(N0) below which solidifying nanoclusters remain noncrystalline are estimated. These values are found to be N0 = 22.8156 and T0 = 400.851 K. The N dependences for silicon melting parameters, namely, a jump of entropy of melting, latent melting heat, slope of the melting line, and jumps in the surface energy and volume, are derived.

About the authors

M. N. Magomedov

Institute of Geothermal Problems

Author for correspondence.
Email: mahmag4@mail.ru
Russian Federation, ul. Chamilia 39a, Makhachkala, Dagestan, 367030

Supplementary files

Supplementary Files
Action
1. JATS XML

Copyright (c) 2016 Pleiades Publishing, Ltd.