On the size dependence of melting parameters for silicon
- Авторлар: Magomedov M.N.1
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Мекемелер:
- Institute of Geothermal Problems
- Шығарылым: Том 61, № 5 (2016)
- Беттер: 730-733
- Бөлім: Solid State
- URL: https://journal-vniispk.ru/1063-7842/article/view/197192
- DOI: https://doi.org/10.1134/S1063784216050157
- ID: 197192
Дәйексөз келтіру
Аннотация
Using the dependences of melting point Tm and crystallization point Tc on the number of atoms (N) in a spherical silicon crystal that were calculated elsewhere [6] by the method of molecular dynamics, (i) the number of atoms at which the latent heat of the solid–liquid phase transition disappears and (ii) temperature T0 = Tm(N0) = Tc(N0) below which solidifying nanoclusters remain noncrystalline are estimated. These values are found to be N0 = 22.8156 and T0 = 400.851 K. The N dependences for silicon melting parameters, namely, a jump of entropy of melting, latent melting heat, slope of the melting line, and jumps in the surface energy and volume, are derived.
Авторлар туралы
M. Magomedov
Institute of Geothermal Problems
Хат алмасуға жауапты Автор.
Email: mahmag4@mail.ru
Ресей, ul. Chamilia 39a, Makhachkala, Dagestan, 367030
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