Reducibility of PbO in Lead Silicate Glasses


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Abstract

X-ray diffraction data and X-ray fluorescence analysis data for microchannel plates are presented. From X-ray diffraction patterns, one can estimate the amount of reduced lead in microchannel plates and make sure of the presence of both metallic lead and semiconducting PbOx with a variable oxygen content.

About the authors

A. F. Eremina

Physicotechnical Department

Email: ramazan62442@gmail.com
Russian Federation, Vladikavkaz, 362025

O. R. Archegova

Physicotechnical Department

Email: ramazan62442@gmail.com
Russian Federation, Vladikavkaz, 362025

R. S. Esenov

Physicotechnical Department

Author for correspondence.
Email: ramazan62442@gmail.com
Russian Federation, Vladikavkaz, 362025

A. T. Nakusov

Physicotechnical Department

Email: ramazan62442@gmail.com
Russian Federation, Vladikavkaz, 362025

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