Email this article Quality Control of ZnGeP2 Single Crystals Using Optical Methods
- Authors: Dyomin V.V.1, Polovtsev I.G.1, Kamenev D.V.1
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Affiliations:
- National Research Tomsk State University
- Issue: Vol 58, No 10 (2016)
- Pages: 1479-1481
- Section: Article
- URL: https://journal-vniispk.ru/1064-8887/article/view/236795
- DOI: https://doi.org/10.1007/s11182-016-0672-4
- ID: 236795
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Abstract
A method for detection of subsurface defects in ZnGeP2crystals is proposed. Evaluation of this method is performed and experimental results are presented.
About the authors
V. V. Dyomin
National Research Tomsk State University
Email: kamenev87@mail.ru
Russian Federation, Tomsk
I. G. Polovtsev
National Research Tomsk State University
Email: kamenev87@mail.ru
Russian Federation, Tomsk
D. V. Kamenev
National Research Tomsk State University
Author for correspondence.
Email: kamenev87@mail.ru
Russian Federation, Tomsk
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