电邮这篇文章 Quality Control of ZnGeP2 Single Crystals Using Optical Methods
- 作者: Dyomin V.V.1, Polovtsev I.G.1, Kamenev D.V.1
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隶属关系:
- National Research Tomsk State University
- 期: 卷 58, 编号 10 (2016)
- 页面: 1479-1481
- 栏目: Article
- URL: https://journal-vniispk.ru/1064-8887/article/view/236795
- DOI: https://doi.org/10.1007/s11182-016-0672-4
- ID: 236795
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详细
A method for detection of subsurface defects in ZnGeP2crystals is proposed. Evaluation of this method is performed and experimental results are presented.
作者简介
V. Dyomin
National Research Tomsk State University
Email: kamenev87@mail.ru
俄罗斯联邦, Tomsk
I. Polovtsev
National Research Tomsk State University
Email: kamenev87@mail.ru
俄罗斯联邦, Tomsk
D. Kamenev
National Research Tomsk State University
编辑信件的主要联系方式.
Email: kamenev87@mail.ru
俄罗斯联邦, Tomsk
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