Benchmarking the Reliability of the Consignments of Semiconductor Articles Using Electrostatic Discharges
- Autores: Gorlov M.I.1, Strogonov A.V.1, Vinokurov A.A.1
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Afiliações:
- Voronezh State Technical University
- Edição: Volume 54, Nº 6 (2018)
- Páginas: 455-461
- Seção: Electrical Methods
- URL: https://journal-vniispk.ru/1061-8309/article/view/181719
- DOI: https://doi.org/10.1134/S1061830918060025
- ID: 181719
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Resumo
Five methods that have been developed by the authors since 2006 for benchmarking the reliability of semiconductor articles using electrostatic discharges are described.
Sobre autores
M. Gorlov
Voronezh State Technical University
Autor responsável pela correspondência
Email: m-gorlov@inbox.ru
Rússia, Voronezh, 394026
A. Strogonov
Voronezh State Technical University
Email: m-gorlov@inbox.ru
Rússia, Voronezh, 394026
A. Vinokurov
Voronezh State Technical University
Email: m-gorlov@inbox.ru
Rússia, Voronezh, 394026
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