Email this article Benchmarking the Reliability of the Consignments of Semiconductor Articles Using Electrostatic Discharges
- Authors: Gorlov M.I.1, Strogonov A.V.1, Vinokurov A.A.1
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Affiliations:
- Voronezh State Technical University
- Issue: Vol 54, No 6 (2018)
- Pages: 455-461
- Section: Electrical Methods
- URL: https://journal-vniispk.ru/1061-8309/article/view/181719
- DOI: https://doi.org/10.1134/S1061830918060025
- ID: 181719
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Abstract
Five methods that have been developed by the authors since 2006 for benchmarking the reliability of semiconductor articles using electrostatic discharges are described.
About the authors
M. I. Gorlov
Voronezh State Technical University
Author for correspondence.
Email: m-gorlov@inbox.ru
Russian Federation, Voronezh, 394026
A. V. Strogonov
Voronezh State Technical University
Email: m-gorlov@inbox.ru
Russian Federation, Voronezh, 394026
A. A. Vinokurov
Voronezh State Technical University
Email: m-gorlov@inbox.ru
Russian Federation, Voronezh, 394026
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