Carrier velocity effect on carbon nanotube Schottky contact
- 作者: Fathi A.1, Ahmadi M.T.2,3, Ismail R.2
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隶属关系:
- Department of Electrical Engineering, Microelectronic Research Laboratory
- Department of Electronic Engineering
- Nanotechnology Research Center, Nanoelectronic Group, Physics Department
- 期: 卷 50, 编号 8 (2016)
- 页面: 1056-1059
- 栏目: Carbon Systems
- URL: https://journal-vniispk.ru/1063-7826/article/view/197647
- DOI: https://doi.org/10.1134/S1063782616080285
- ID: 197647
如何引用文章
详细
One of the most important drawbacks which caused the silicon based technologies to their technical limitations is the instability of their products at nano-level. On the other side, carbon based materials such as carbon nanotube (CNT) as alternative materials have been involved in scientific efforts. Some of the important advantages of CNTs over silicon components are high mechanical strength, high sensing capability and large surface-to-volume ratio. In this article, the model of CNT Schottky transistor current which is under exterior applied voltage is employed. This model shows that its current has a weak dependence on thermal velocity corresponding to the small applied voltage. The conditions are quite different for high bias voltages which are independent of temperature. Our results indicate that the current is increased by Fermi velocity, but the I–V curves will not have considerable changes with the variations in number of carriers. It means that the current doesn’t increase sharply by voltage variations over different number of carriers.
作者简介
Amir Fathi
Department of Electrical Engineering, Microelectronic Research Laboratory
编辑信件的主要联系方式.
Email: fathi.amir@hotmail.com
伊朗伊斯兰共和国, Urmia
M. Ahmadi
Department of Electronic Engineering; Nanotechnology Research Center, Nanoelectronic Group, Physics Department
Email: fathi.amir@hotmail.com
马来西亚, Skudai, Johor Darul Takzim, 81310; Urmia, 57147
Razali Ismail
Department of Electronic Engineering
Email: fathi.amir@hotmail.com
马来西亚, Skudai, Johor Darul Takzim, 81310
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