Method of investigation of galvanomagnetic properties of CdxHg1 − xTe and CdxHg1 − xTe/Cd1 − yZnyTe

Аннотация

The galvanomagnetic Van der Pau measurements are carried out on single-crystalline Cd_xHg_1−xTe (MCT) bulk samples and Cd_xHg_{1 − x}Te/Cd_{1 − y}Zn_yTe (MCT/CZT) (x ≈ 0.2) epitaxial heterostructures at the temperature of 295 and 77 K. The sample rotates together with the cryostat in the electromagnet field through the angle from 0° to 360° with the step of 6°. It is shown that the angular dependences of the voltage under measurement are sinusoidal for the p-MCT bulk sample at the temperatures of 77 K; i.e., the Hall coefficient is independent of the magnetic-field induction. However, the angular dependences of the measured signal appreciably differ from sinusoids for the MCT/CZT epitaxial heterostructures at the temperature of 77 K.