Автор туралы ақпарат

Volodin, V. A.

Шығарылым Бөлім Атауы Файл
Том 50, № 7 (2016) Semiconductor Structures, Low-Dimensional Systems, and Quantum Phenomena Optical properties of p–i–n structures based on amorphous hydrogenated silicon with silicon nanocrystals formed via nanosecond laser annealing
Том 51, № 9 (2017) Fabrication, Treatment, and Testing of Materials and Structures Specific features of the ion-beam synthesis of Ge nanocrystals in SiO2 thin films
Том 51, № 10 (2017) Fabrication, Treatment, and Testing of Materials and Structures Formation and study of p–i–n structures based on two-phase hydrogenated silicon with a germanium layer in the i-type region
Том 52, № 2 (2018) Fabrication, Treatment, and Testing of Materials and Structures Ion-Beam Synthesis of the Crystalline Ge Phase in SiOxNy Films upon Annealing under High Pressure
Том 52, № 5 (2018) XXV International Symposium “Nanostructures: Physics and Technology”, Saint Petersburg, Russia, June 26–30, 2017. Nanostructure Technology New Method of Porous Ge Layer Fabrication: Structure and Optical Properties
Том 52, № 6 (2018) Spectroscopy, Interaction with Radiation Forbidden Resonant Raman Scattering in GaAs/AlAs Superlattices: Experiment and Calculations
Том 52, № 9 (2018) Microcrystalline, Nanocrystalline, Porous, and Composite Semiconductors On the Formation of IR-Light-Emitting Ge Nanocrystals in Ge:SiO2 Films
Том 53, № 3 (2019) Fabrication, Treatment, and Testing of Materials and Structures Crystallization of Amorphous Germanium Films and Multilayer a-Ge/a-Si Structures upon Exposure to Nanosecond Laser Radiation
Том 53, № 4 (2019) Microcrystalline, Nanocrystalline, Porous, and Composite Semiconductors Raman Scattering in InSb Spherical Nanocrystals Ion-Synthesized in Silicon-Oxide Films
Том 53, № 11 (2019) Spectroscopy, Interaction with Radiation Luminescence Properties of FZ Silicon Irradiated with Swift Heavy Ions
Том 53, № 16 (2019) Nanostructures Technology Study of Structural Modification of Composites with Ge Nanoclusters by Optical and Electron Microscopy Methods