Optical properties of In2Se3 thin films
- 作者: Bodnar I.V.1
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隶属关系:
- Belarusian State University of Information and Radio Electronics
- 期: 卷 50, 编号 6 (2016)
- 页面: 715-718
- 栏目: Electronic Properties of Semiconductors
- URL: https://journal-vniispk.ru/1063-7826/article/view/197189
- DOI: https://doi.org/10.1134/S1063782616060026
- ID: 197189
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详细
In2Se3 films are produced by ion-beam evaporation at substrate temperatures of 313 and 623 K. As the target, In2Se3 single crystals grown by the vertical Bridgman method are used. The composition and structure of the crystals and films are determined by the X-ray spectral analysis and X-ray diffraction techniques, respectively. It is established that the crystals and films crystallize with the formation of a hexagonal structure. The band gap and refractive index of the In2Se3 films are determined from the transmittance and reflectance spectra. It is found that, as the substrate temperature is increased, the band gap increases.
作者简介
I. Bodnar
Belarusian State University of Information and Radio Electronics
编辑信件的主要联系方式.
Email: chemzav@bsuir.by
白俄罗斯, Minsk, 220013
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