Antisite Defects in Ge–Te and Ge–As–Te Semiconductor Glasses


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Resumo

The formation of antisite defects in Ge20Te80 and Ge15As4Te81 vitreous alloys in the form of tin atoms in tellurium sites and tellurium atoms in germanium sites is shown by emission Mössbauer spectroscopy with the 119mmSn(119mSn), 119mTe(119mSn), 125Sn(125Te), and 125mTe(125Te) isotopes. It is shown that the isovalent substitution of germanium atoms by tin atoms does not vary the symmetry of the local surrounding of germanium sites, while tin and tellurium atoms reconstruct their local surrounding in sites unnatural for them.

Sobre autores

A. Marchenko

Herzen State Pedagogical University of Russia

Email: ppseregin@mail.ru
Rússia, St. Petersburg, 191186

P. Seregin

Herzen State Pedagogical University of Russia

Autor responsável pela correspondência
Email: ppseregin@mail.ru
Rússia, St. Petersburg, 191186

E. Terukov

Saint Petersburg Electrotechnical University LETI

Email: ppseregin@mail.ru
Rússia, St. Petersburg, 197376

K. Shakhovich

Herzen State Pedagogical University of Russia

Email: ppseregin@mail.ru
Rússia, St. Petersburg, 191186

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