Antisite Defects in Ge–Te and Ge–As–Te Semiconductor Glasses
- Autores: Marchenko A.V.1, Seregin P.P.1, Terukov E.I.2, Shakhovich K.B.1
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Afiliações:
- Herzen State Pedagogical University of Russia
- Saint Petersburg Electrotechnical University LETI
- Edição: Volume 53, Nº 5 (2019)
- Páginas: 711-716
- Seção: Amorphous, Vitreous, and Organic Semiconductors
- URL: https://journal-vniispk.ru/1063-7826/article/view/206219
- DOI: https://doi.org/10.1134/S1063782619050166
- ID: 206219
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Resumo
The formation of antisite defects in Ge20Te80 and Ge15As4Te81 vitreous alloys in the form of tin atoms in tellurium sites and tellurium atoms in germanium sites is shown by emission Mössbauer spectroscopy with the 119mmSn(119mSn), 119mTe(119mSn), 125Sn(125Te), and 125mTe(125Te) isotopes. It is shown that the isovalent substitution of germanium atoms by tin atoms does not vary the symmetry of the local surrounding of germanium sites, while tin and tellurium atoms reconstruct their local surrounding in sites unnatural for them.
Sobre autores
A. Marchenko
Herzen State Pedagogical University of Russia
Email: ppseregin@mail.ru
Rússia, St. Petersburg, 191186
P. Seregin
Herzen State Pedagogical University of Russia
Autor responsável pela correspondência
Email: ppseregin@mail.ru
Rússia, St. Petersburg, 191186
E. Terukov
Saint Petersburg Electrotechnical University LETI
Email: ppseregin@mail.ru
Rússia, St. Petersburg, 197376
K. Shakhovich
Herzen State Pedagogical University of Russia
Email: ppseregin@mail.ru
Rússia, St. Petersburg, 191186
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