Derivation of an analytical expression for a physical process from an experimental curve with kinks
- 作者: Davydov V.N.1, Kharitonov S.V.1, Lugina N.E.1, Melnik K.P.1
-
隶属关系:
- Tomsk State University of Control Systems and Radioelectronics
- 期: 卷 51, 编号 9 (2017)
- 页面: 1174-1179
- 栏目: Physics of Semiconductor Devices
- URL: https://journal-vniispk.ru/1063-7826/article/view/201146
- DOI: https://doi.org/10.1134/S1063782617090093
- ID: 201146
如何引用文章
详细
A technique for deriving an analytical expression describing an experimental curve with one or several kinks is proposed. Depending on the pattern of the partial processes involved in the resulting process, derivation is based on calculating either their sum or geometric mean. “Participation functions” of the processes, whose run is determined by the coordinate of the intersection point of the processes and the “accuracy parameter,” are introduced into these expressions in order to increase the approximation accuracy. The choice of these parameters provides a correspondence between the approximation accuracy and the accuracy of measuring the experimental curve. Application of this technique in analytical calculations consisting of a combination of several processes and in the derivation of an analytical expression for an experimental curve with kinks is demonstrated. The thus obtained approximating expression, characterized by clarity, a high approximation accuracy, and physical simplicity, may be used to calculate other characteristics of a semiconductor device.
作者简介
V. Davydov
Tomsk State University of Control Systems and Radioelectronics
编辑信件的主要联系方式.
Email: dvn@fet.tusur.ru
俄罗斯联邦, Tomsk, 634050
S. Kharitonov
Tomsk State University of Control Systems and Radioelectronics
Email: dvn@fet.tusur.ru
俄罗斯联邦, Tomsk, 634050
N. Lugina
Tomsk State University of Control Systems and Radioelectronics
Email: dvn@fet.tusur.ru
俄罗斯联邦, Tomsk, 634050
K. Melnik
Tomsk State University of Control Systems and Radioelectronics
Email: dvn@fet.tusur.ru
俄罗斯联邦, Tomsk, 634050
补充文件
