Growth and optical properties of filamentary GaN nanocrystals grown on a hybrid SiC/Si(111) substrate by molecular beam epitaxy
- Authors: Reznik R.R.1,2,3, Kotlyar K.P.1,4, Il’kiv I.V.1,2, Soshnikov I.P.1,4,5, Kukushkin S.A.1,3,6, Osipov A.V.1,3,6, Nikitina E.V.1, Cirlin G.E.1,3,7
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Affiliations:
- St. Petersburg Academic University
- Peter the Great St. Petersburg Polytechnic University
- ITMO University
- Ioffe Physiсal-Techniсal Institute
- St. Petersburg Electrotechnical University “LETI,”
- Institute of Problems of Mechanical Engineering
- Institute for Analytical Instrumentation
- Issue: Vol 58, No 10 (2016)
- Pages: 1952-1955
- Section: Semiconductors
- URL: https://journal-vniispk.ru/1063-7834/article/view/198751
- DOI: https://doi.org/10.1134/S1063783416100292
- ID: 198751
Cite item
Abstract
The potential to grow filamentary GaN nanocrystals by molecular beam epitaxy on a silicon substrate with a nanosized buffer layer of silicon carbide has been demonstrated. Morphological and optical properties of the obtained system have been studied. It has been shown that the intensity of the photoluminescence spectrum peak of such structures is higher than that of the best filamentary GaN nanocrystals without the buffer silicon carbide layer by a factor of more than two.
About the authors
R. R. Reznik
St. Petersburg Academic University; Peter the Great St. Petersburg Polytechnic University; ITMO University
Author for correspondence.
Email: moment92@mail.ru
Russian Federation, ul. Khlopina 8/3, St. Petersburg, 194021; Politekhnicheskaya ul. 29, St. Petersburg, 195251; Kronverkskii pr. 49, St. Petersburg, 197101
K. P. Kotlyar
St. Petersburg Academic University; Ioffe Physiсal-Techniсal Institute
Email: moment92@mail.ru
Russian Federation, ul. Khlopina 8/3, St. Petersburg, 194021; Politekhnicheskaya ul. 26, St. Petersburg, 194021
I. V. Il’kiv
St. Petersburg Academic University; Peter the Great St. Petersburg Polytechnic University
Email: moment92@mail.ru
Russian Federation, ul. Khlopina 8/3, St. Petersburg, 194021; Politekhnicheskaya ul. 29, St. Petersburg, 195251
I. P. Soshnikov
St. Petersburg Academic University; Ioffe Physiсal-Techniсal Institute; St. Petersburg Electrotechnical University “LETI,”
Email: moment92@mail.ru
Russian Federation, ul. Khlopina 8/3, St. Petersburg, 194021; Politekhnicheskaya ul. 26, St. Petersburg, 194021; ul. Popova 5/5, St. Petersburg, 197376
S. A. Kukushkin
St. Petersburg Academic University; ITMO University; Institute of Problems of Mechanical Engineering
Email: moment92@mail.ru
Russian Federation, ul. Khlopina 8/3, St. Petersburg, 194021; Kronverkskii pr. 49, St. Petersburg, 197101; Bol’shoi pr. 61, St. Petersburg, 199178
A. V. Osipov
St. Petersburg Academic University; ITMO University; Institute of Problems of Mechanical Engineering
Email: moment92@mail.ru
Russian Federation, ul. Khlopina 8/3, St. Petersburg, 194021; Kronverkskii pr. 49, St. Petersburg, 197101; Bol’shoi pr. 61, St. Petersburg, 199178
E. V. Nikitina
St. Petersburg Academic University
Email: moment92@mail.ru
Russian Federation, ul. Khlopina 8/3, St. Petersburg, 194021
G. E. Cirlin
St. Petersburg Academic University; ITMO University; Institute for Analytical Instrumentation
Email: moment92@mail.ru
Russian Federation, ul. Khlopina 8/3, St. Petersburg, 194021; Kronverkskii pr. 49, St. Petersburg, 197101; Rizhskii pr. 26, St. Petersburg, 190103
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