Analysis of reliability of semiconductor emitters with different designs of cavities

A. V. Ivanov; V. D. Kurnosov; K. V. Kurnosov; Yu. V. Kurnyavko; A. V. Lobintsov; A. S. Meshkov; V. N. Penkin; V. I. Romantsevich; M. B. Uspenskii; R. V. Chernov

doi:10.1134/S1063784216100157

Analysis of reliability of semiconductor emitters with different designs of cavities

Autores: Ivanov A.V.¹, Kurnosov V.D.¹, Kurnosov K.V.¹, Kurnyavko Y.V.¹, Lobintsov A.V.¹, Meshkov A.S.¹, Penkin V.N.¹, Romantsevich V.I.¹, Uspenskii M.B.¹, Chernov R.V.¹
Afiliações:
1. Stelmakh Polyus Research Institute
Edição: Volume 61, Nº 10 (2016)
Páginas: 1525-1530
Seção: Solid State Electronics
URL: https://journal-vniispk.ru/1063-7842/article/view/198241
DOI: https://doi.org/10.1134/S1063784216100157
ID: 198241

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We have reported on the results of analysis of the operating time of conventional laser diodes and diodes with noninjecting output sections. The reasons for shorter operating time of diodes with a single anti-reflection face of the cavity compared to diodes with two protecting coatings and emitters equipped with a fiber Bragg grating have been considered.