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Selective Sensors of Nitrogen Dioxide Based on Thin Tungsten Oxide Films under Optical Irradiation
Almaev A.V., Yakovlev N.N., Chernikov E.V., Tolbanov O.P.
Peculiarities of the Structure and Properties of Thin PZT Films with Strongly Nonuniform Depth–Composition Profiles
Dolgintsev D.M., Staritsyn M.V., Pronin V.P., Kaptelov E.Y., Senkevich S.V., Pronin I.P., Nemov S.A.
Assessing the Thickness of Thin Films Based on Elemental Data Composition of Film Structures
Nikolaenko Y.M., Korneevets A.S., Efros N.B., Burkhovetskii V.V., Reshidova I.Y.
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