Calibration of X-Ray Diffraction Instruments for Residual-Stress Measurement
- 作者: Trofimov V.N.1, Karmanov V.V.1, Shiryaev A.A.1, Zvonov S.N.2
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隶属关系:
- Perm State Polytechnic University
- OOO Xena
- 期: 卷 39, 编号 3 (2019)
- 页面: 276-278
- 栏目: Article
- URL: https://journal-vniispk.ru/1068-798X/article/view/227680
- DOI: https://doi.org/10.3103/S1068798X19030225
- ID: 227680
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详细
The deficiencies of existing standard iron and nickel samples for calibration by means of X-ray diffraction are noted. These standards cannot be used in calibration by magnetic noise recording. A new calibration method based on X-ray diffraction is proposed, using plane samples of the material employed in the manufacture of the actual structures. Theoretical analysis provides the basis for the development of null standards in which a plane sample is deformed by pure flexure or in a cantilever-beam configuration.
作者简介
V. Trofimov
Perm State Polytechnic University
编辑信件的主要联系方式.
Email: tvn_perm@mail.ru
俄罗斯联邦, Perm, 614990
V. Karmanov
Perm State Polytechnic University
编辑信件的主要联系方式.
Email: karmanovs@yandex.ru
俄罗斯联邦, Perm, 614990
A. Shiryaev
Perm State Polytechnic University
编辑信件的主要联系方式.
Email: alex_sh_23-1@mail.ru
俄罗斯联邦, Perm, 614990
S. Zvonov
OOO Xena
编辑信件的主要联系方式.
Email: info@kcena.ru
俄罗斯联邦, Perm, 614000
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