Calibration of X-Ray Diffraction Instruments for Residual-Stress Measurement
- Авторлар: Trofimov V.N.1, Karmanov V.V.1, Shiryaev A.A.1, Zvonov S.N.2
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Мекемелер:
- Perm State Polytechnic University
- OOO Xena
- Шығарылым: Том 39, № 3 (2019)
- Беттер: 276-278
- Бөлім: Article
- URL: https://journal-vniispk.ru/1068-798X/article/view/227680
- DOI: https://doi.org/10.3103/S1068798X19030225
- ID: 227680
Дәйексөз келтіру
Аннотация
The deficiencies of existing standard iron and nickel samples for calibration by means of X-ray diffraction are noted. These standards cannot be used in calibration by magnetic noise recording. A new calibration method based on X-ray diffraction is proposed, using plane samples of the material employed in the manufacture of the actual structures. Theoretical analysis provides the basis for the development of null standards in which a plane sample is deformed by pure flexure or in a cantilever-beam configuration.
Авторлар туралы
V. Trofimov
Perm State Polytechnic University
Хат алмасуға жауапты Автор.
Email: tvn_perm@mail.ru
Ресей, Perm, 614990
V. Karmanov
Perm State Polytechnic University
Хат алмасуға жауапты Автор.
Email: karmanovs@yandex.ru
Ресей, Perm, 614990
A. Shiryaev
Perm State Polytechnic University
Хат алмасуға жауапты Автор.
Email: alex_sh_23-1@mail.ru
Ресей, Perm, 614990
S. Zvonov
OOO Xena
Хат алмасуға жауапты Автор.
Email: info@kcena.ru
Ресей, Perm, 614000
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