Electrical Breakdown in Pure n- and p-Si

Resumo

The results of calculations of the dependences of the kinetic coefficients of impact ionization and thermal recombination on an electric field in pure silicon are presented. By analogy with germanium, the dependences of the breakdown field Е_br on the material compensation ratio K are calculated. The validity of such calculation is justified in detail. The Е_br(K) curves are presented and compared with experimental data in the weak-compensation region. Matching with experimental results at which satisfactory agreement between theory and experiment is observed is performed.