Informaçao sobre o Autor

Obolensky, S. V.

Edição Seção Título Arquivo
Volume 50, Nº 3 (2016) Semiconductor Structures, Low-Dimensional Systems, and Quantum Phenomena Study of the Electron Distribution in GaN and GaAs after γ-Neutron Irradiation
Volume 50, Nº 11 (2016) XX International Symposium “Nanophysics and Nanoelectronics”, Nizhny Novgorod, March 14–18, 2016 Simulation of electron transport in GaAs/AlAs superlattices with a small number of periods for the THz frequency range
Volume 50, Nº 12 (2016) XX International Symposium “Nanophysics and Nanoelectronics”, Nizhny Novgorod, March 14–18, 2016 Theoretical and experimental studies of the current–voltage and capacitance–voltage of HEMT structures and field-effect transistors
Volume 50, Nº 12 (2016) XX International Symposium “Nanophysics and Nanoelectronics”, Nizhny Novgorod, March 14–18, 2016 Microwave-signal generation in a planar Gunn diode with radiation exposure taken into account
Volume 51, Nº 11 (2017) XXI International Symposium “Nanophysics and Nanoelectronics”, Nizhny Novgorod, March 13–16, 2017 Transport of hot charge carriers in Si, GaAs, InGaAs, and GaN submicrometer semiconductor structures with nanometer-scale clusters of radiation-induced defects
Volume 51, Nº 11 (2017) XXI International Symposium “Nanophysics and Nanoelectronics”, Nizhny Novgorod, March 13–16, 2017 Optimization of the superlattice parameters for THz diodes
Volume 51, Nº 11 (2017) XXI International Symposium “Nanophysics and Nanoelectronics”, Nizhny Novgorod, March 13–16, 2017 Analysis of the GaN-HEMT parameters before and after gamma-neutron irradiation
Volume 52, Nº 11 (2018) Xxii International Symposium “Nanophysics and Nanoelectronics”, Nizhny Novgorod, March 12–15, 2018 Development of a Physical-Topological Model for the Response of a High-Power Vertical DMOS Transistor to the Effect of Pulsed Gamma-Radiation
Volume 52, Nº 12 (2018) Xxii International Symposium “Nanophysics and Nanoelectronics”, Nizhny Novgorod, March 12–15, 2018 Analysis of the Behavior of Nonequilibrium Semiconductor Structures and Microwave Transistors During and After Pulsed γ- and γ-Neutron Irradiation
Volume 53, Nº 3 (2019) Physics of Semiconductor Devices Investigation into the Radiation Hardness of Photodiodes Based on Silicon-on-Sapphire Structures
Volume 53, Nº 10 (2019) Xxiii International Symposium “Nanophysics and Nanoelectronics”, Nizhny Novgorod, March 11–14, 2019 Comparison of the Radiation Resistance of Prospective Bipolar and Heterobipolar Transistors