Biosensor properties of SOI nanowire transistors with a PEALD Al2O3 dielectric protective layer


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Аннотация

The properties of protective dielectric layers of aluminum oxide Al2O3 applied to prefabricated silicon-nanowire transistor biochips by the plasma enhanced atomic layer deposition (PEALD) method before being housed are studied depending on the deposition and annealing modes. Coating the natural silicon oxide with a nanometer Al2O3 layer insignificantly decreases the femtomole sensitivity of biosensors, but provides their stability in bioliquids. In deionized water, transistors with annealed aluminum oxide are closed due to the trapping of negative charges of <(1–10) × 1011 cm−2 at surface states. The application of a positive potential to the substrate (Vsub > 25 V) makes it possible to eliminate the negative charge and to perform multiple measurements in liquid at least for half a year.

Авторлар туралы

V. Popov

Rzhanov Institute of Semiconductor Physics, Siberian Branch

Хат алмасуға жауапты Автор.
Email: popov@isp.nsc.ru
Ресей, pr. Akad. Lavrent’eva 13, Novosibirsk, 630090

M. Ilnitskii

Rzhanov Institute of Semiconductor Physics, Siberian Branch

Email: popov@isp.nsc.ru
Ресей, pr. Akad. Lavrent’eva 13, Novosibirsk, 630090

E. Zhanaev

Rzhanov Institute of Semiconductor Physics, Siberian Branch

Email: popov@isp.nsc.ru
Ресей, pr. Akad. Lavrent’eva 13, Novosibirsk, 630090

A. Myakon’kich

Physical Technological Institute

Email: popov@isp.nsc.ru
Ресей, Nakhimovskii pr. 36/1, Moscow, 117218

K. Rudenko

Physical Technological Institute

Email: popov@isp.nsc.ru
Ресей, Nakhimovskii pr. 36/1, Moscow, 117218

A. Glukhov

Novosibirsk Semiconductor Device Plant and Design Bureau

Email: popov@isp.nsc.ru
Ресей, ul. Dachnaya 60, Novosibirsk, 630082

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