Field-Effect Transistor Based on the Proton Conductivity of Graphene Oxide and Nafion Films


Дәйексөз келтіру

Толық мәтін

Ашық рұқсат Ашық рұқсат
Рұқсат жабық Рұқсат берілді
Рұқсат жабық Тек жазылушылар үшін

Аннотация

Proton conductivity in graphene oxide and Nafion films depending on humidity and voltages across electrodes is studied in the model of a field-effect transistor. The electrical characteristics of the films are similar to one another, but the mobility of positive charges in Nafion and the current gain are higher by 2–3 orders of magnitude compared with graphene oxide. The negative ion current in graphene-oxide films at positive bias voltage is significant compared with the proton current (up to ~10%), while it is almost lacking in Nafion films (<1%).

Авторлар туралы

V. Smirnov

Institute of Problems of Chemical Physics

Хат алмасуға жауапты Автор.
Email: vas@icp.ac.ru
Ресей, Chernogolovka, Moscow oblast, 142432

A. Mokrushin

Institute of Microelectronics Technology and High Purity Materials

Email: vas@icp.ac.ru
Ресей, Chernogolovka, Moscow oblast, 142432

N. Denisov

Institute of Problems of Chemical Physics

Email: vas@icp.ac.ru
Ресей, Chernogolovka, Moscow oblast, 142432

Yu. Dobrovolskii

Institute of Problems of Chemical Physics

Email: vas@icp.ac.ru
Ресей, Chernogolovka, Moscow oblast, 142432

Қосымша файлдар

Қосымша файлдар
Әрекет
1. JATS XML

© Pleiades Publishing, Ltd., 2018