Isothermal current–voltage characteristics of high-voltage 4H-SiC junction barrier Schottky rectifiers
- Авторлар: Levinshtein M.E.1, Ivanov P.A.1, Zhang Q.J.2, Palmour J.W.2
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Мекемелер:
- Ioffe Physical–Technical Institute
- Cree Inc., 4600 Silicon Dr.
- Шығарылым: Том 50, № 5 (2016)
- Беттер: 656-661
- Бөлім: Physics of Semiconductor Devices
- URL: https://journal-vniispk.ru/1063-7826/article/view/197119
- DOI: https://doi.org/10.1134/S1063782616050158
- ID: 197119
Дәйексөз келтіру
Аннотация
The forward-pulse isothermal current–voltage characteristics of 4H-SiC junction barrier Schottky rectifiers (JBSs) with a nominal blocking voltage of 1700 V are measured in the temperature range from–80 to +90°C (193–363 K) up to current densities j of ~5600 A/cm2 at–80°C and 3000 A/cm2 at +90°C. In these measurements, the overheating of the structures relative to the ambient temperature, ΔT, did not exceed several degrees. At higher current densities, the effective injection of minority carriers (holes) into the base of the structures is observed, which is accompanied by the appearance of an S-type differential resistance. The pulsed isothermal current–voltage characteristics are also measured at a temperature of 77 K.
Негізгі сөздер
Авторлар туралы
M. Levinshtein
Ioffe Physical–Technical Institute
Хат алмасуға жауапты Автор.
Email: melev@nimis.ioffe.ru
Ресей, St. Petersburg, 194021
P. Ivanov
Ioffe Physical–Technical Institute
Email: melev@nimis.ioffe.ru
Ресей, St. Petersburg, 194021
Q. Zhang
Cree Inc., 4600 Silicon Dr.
Email: melev@nimis.ioffe.ru
АҚШ, Durham, NC, 27703
J. Palmour
Cree Inc., 4600 Silicon Dr.
Email: melev@nimis.ioffe.ru
АҚШ, Durham, NC, 27703
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