Single electron transistor: Energy-level broadening effect and thermionic contribution


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Аннотация

In this paper, a theoretical study of single electron transistor (SET) based on silicon quantum dot (Si–QD) has been studied. We have used a novel approach based on the orthodox theory. We studied the energy–level broadening effect on the performance of the SET, where the tunnel resistance depends on the discrete energy. We have investigated the IV curves, taking into account the effects of the energy-level broadening, temperature and bias voltage. The presence of Coulomb blockade phenomena and its role to obtain the negative differential resistance (NDR) have been also outlined.

Авторлар туралы

A. Nasri

University of Monastir, Microelectronics and Instrumentation laboratory

Хат алмасуға жауапты Автор.
Email: abdelgafar@hotmail.fr
Тунис, Av de l’environnement, Monastir, 5019

A. Boubaker

University of Monastir, Microelectronics and Instrumentation laboratory

Email: abdelgafar@hotmail.fr
Тунис, Av de l’environnement, Monastir, 5019

W. Khaldi

CNRS, Centrale Lille, ISEN

Email: abdelgafar@hotmail.fr
Франция, Lille, 59000

B. Hafsi

CNRS, Centrale Lille, ISEN

Email: abdelgafar@hotmail.fr
Франция, Lille, 59000

A. Kalboussi

University of Monastir, Microelectronics and Instrumentation laboratory

Email: abdelgafar@hotmail.fr
Тунис, Av de l’environnement, Monastir, 5019

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